DocumentCode :
1165260
Title :
Book Reviews: Plumbing the Depths of Leakage
Author :
Sapatnekar, Sachin
Author_Institution :
University of Minnesota
Volume :
23
Issue :
4
fYear :
2006
fDate :
4/1/2006 12:00:00 AM
Firstpage :
318
Lastpage :
319
Abstract :
A review of Leakage in Nanometer CMOS Technologies, edited by Siva G. Narendra and Anantha Chandrakasan (Springer, 2006).
Keywords :
leakage; nanometer CMOS technology; Book reviews; CMOS technology; Circuit synthesis; Dynamic voltage scaling; Leakage current; Macrocell networks; Semiconductor device modeling; Sleep; Stacking; Transistors; leakage; nanometer CMOS technology;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2006.87
Filename :
1683722
Link To Document :
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