• DocumentCode
    1165260
  • Title

    Book Reviews: Plumbing the Depths of Leakage

  • Author

    Sapatnekar, Sachin

  • Author_Institution
    University of Minnesota
  • Volume
    23
  • Issue
    4
  • fYear
    2006
  • fDate
    4/1/2006 12:00:00 AM
  • Firstpage
    318
  • Lastpage
    319
  • Abstract
    A review of Leakage in Nanometer CMOS Technologies, edited by Siva G. Narendra and Anantha Chandrakasan (Springer, 2006).
  • Keywords
    leakage; nanometer CMOS technology; Book reviews; CMOS technology; Circuit synthesis; Dynamic voltage scaling; Leakage current; Macrocell networks; Semiconductor device modeling; Sleep; Stacking; Transistors; leakage; nanometer CMOS technology;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2006.87
  • Filename
    1683722
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1165260