• DocumentCode
    1165329
  • Title

    A normalized-area measure for VLSI layouts

  • Author

    Krishnan, Musaravakkam S. ; Hayes, John P.

  • Author_Institution
    Xerox Corp., El Segundo, CA, USA
  • Volume
    7
  • Issue
    3
  • fYear
    1988
  • fDate
    3/1/1988 12:00:00 AM
  • Firstpage
    411
  • Lastpage
    419
  • Abstract
    A figure of merit called normalized-area, is introduced for the purpose of evaluating layouts for VLSI networks. This measure is distinctly different from the existing VLSI measures in two major aspects: (1) it expresses the utilization of the layout area by revealing the constant factor hidden in its asymptotic area-complexity; and (2) it distinguishes between node and wire sizes. Normalized-area is valuable in evaluating alternative layouts for a given structure as well as in analyzing the area utilization of a particular layout for that structure in an absolute sense. An analysis of the normalized-area of the layout schemes for regular structures proposed in the literature shows that most of these schemes are infeasible in practice. Array realizations for several well-known regular structures are used to demonstrate the usefulness of the normalized-area measure. Some practical guidelines for placement and routing to achieve good area utilization in a VLSI chip are presented
  • Keywords
    VLSI; circuit layout CAD; CAD; VLSI layouts; asymptotic area-complexity; figure of merit; normalized-area measure; placement; routeing; routing; Area measurement; Guidelines; Helium; Integrated circuit interconnections; Printed circuits; Routing; Semiconductor device measurement; Size measurement; Very large scale integration; Wire;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.3174
  • Filename
    3174