• DocumentCode
    1165421
  • Title

    Error-Correcting Isomorphisms of Attributed Relational Graphs for Pattern Analysis

  • Author

    Tsai, Wen-Hsiang ; Fu, King-Sun

  • Volume
    9
  • Issue
    12
  • fYear
    1979
  • Firstpage
    757
  • Lastpage
    768
  • Abstract
    The pattern deformational model proposed by Tsai and Fu [11] is extended so that numerical attributes and probability or density distributions can be introduced into primitives and relations in a nonhierarchical relational graph. Conventional graph isomorphisms are then generalized to include error-correcting capability for matching deformed patterns represented by such attributed relational graphs. An ordered-search algorithm is proposed for determining error-correcting isomorphisms. Finally, a pattern classification approach using graph isomorphisms is described, which can be considered as a combination of structural and statistical techniques.
  • Keywords
    Chemical analysis; Deformable models; Image analysis; Layout; Pattern analysis; Pattern classification; Pattern matching; Pattern recognition; Prototypes; Relational databases;
  • fLanguage
    English
  • Journal_Title
    Systems, Man and Cybernetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9472
  • Type

    jour

  • DOI
    10.1109/TSMC.1979.4310127
  • Filename
    4310127