Title :
Error-Correcting Isomorphisms of Attributed Relational Graphs for Pattern Analysis
Author :
Tsai, Wen-Hsiang ; Fu, King-Sun
Abstract :
The pattern deformational model proposed by Tsai and Fu [11] is extended so that numerical attributes and probability or density distributions can be introduced into primitives and relations in a nonhierarchical relational graph. Conventional graph isomorphisms are then generalized to include error-correcting capability for matching deformed patterns represented by such attributed relational graphs. An ordered-search algorithm is proposed for determining error-correcting isomorphisms. Finally, a pattern classification approach using graph isomorphisms is described, which can be considered as a combination of structural and statistical techniques.
Keywords :
Chemical analysis; Deformable models; Image analysis; Layout; Pattern analysis; Pattern classification; Pattern matching; Pattern recognition; Prototypes; Relational databases;
Journal_Title :
Systems, Man and Cybernetics, IEEE Transactions on
DOI :
10.1109/TSMC.1979.4310127