DocumentCode :
1165490
Title :
Assessment of Fluxless Solid Liquid Interdiffusion Bonding by Compressive Force of Au-PbSn and Au-SAC for Flip Chip Packaging
Author :
Lee, Teck Kheng ; Zhang, Sam ; Wong, Chee C. ; Tan, A.C.
Author_Institution :
Micron Semicond. Asia, Singapore
Volume :
32
Issue :
1
fYear :
2009
Firstpage :
116
Lastpage :
122
Abstract :
Flip chip packaging faces two primary bonding-process obstacles: flux use and geometry mismatch between die and substrate pad pitch. These obstacles motivated the development of a fluxless bonding method called solid-liquid interdiffusion bonding by compressive force (SLICF). SLICF utilizes a mechanical force to form the bond through solid-liquid interdiffusion with a joint-in-via (JIV) architecture for flip chip packaging. SLICF bonding (also known as thermo-mechanical (TM) bonding) forms an instantaneous bond and eliminates the need for reflow infrastructure. Both Au-PbSn and Au-SAC interconnect systems were studied for the SLICF bonding on the JIV architecture at a 130- mum pitch. The morphologies of Au-PbSn and Au-SAC in solid-liquid interdiffusion were studied with their kinetics measured by the Au consumption rate. The SLIFC bonds for Au-PbSn and Au-SAC were compared and assessed by mechanical shear tests and thermomechanical stresses. Au with PbSn was found to perform marginally better due to its joint geometry and slower kinetics.
Keywords :
chemical interdiffusion; circuit reliability; copper alloys; diffusion bonding; electronics packaging; flip-chip devices; gold; lead alloys; microassembling; reflow soldering; silver alloys; thermomechanical treatment; tin alloys; Au-PbSn; Au-SnAgCu; compressive force; flip chip packaging; fluxless bonding method; fluxless solid-liquid interdiffusion bonding; interconnect systems; joint geometry; joint-in-via architecture; mechanical force; mechanical shear tests; reflow infrastructure; size 130 mum; thermo-mechanical bonding; thermomechanical stresses; Bonding forces; Flip chip; Geometry; Gold; Kinetic theory; Morphology; Packaging; Solids; Testing; Thermomechanical processes; Bonding; flip chip; fluxless; gold; lead free; solder;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/TADVP.2008.2006650
Filename :
4785323
Link To Document :
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