Title :
Thermal stability of indium-tin-oxide/n-GaAs Schottky diodes
Author :
Morgan, D.V. ; Bunce, R.W.
Abstract :
The thermal degradation of ITO Schottky contacts on GaAs has been studied. The rectifying contacts show rapid degradation with heating and could have serious implications for optoelectronic devices that operate at elevated temperatures.
Keywords :
III-V semiconductors; Schottky-barrier diodes; annealing; gallium arsenide; indium compounds; semiconductor materials; solid-state rectifiers; stability; thermal analysis; tin compounds; ITO-GaAs; ITO/n-GaAs; InSnO-GaAs; Schottky diodes; heating; rectifying contacts; thermal degradation;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19920088
