Title :
Enhancement mode n-channel Si/SiGe MODFET with high intrinsic transconductance
Author :
Konig, U. ; Boers, A.J. ; Schaffler, F. ; Kasper, Erich
Author_Institution :
Daimler Benz AG, Ulm, Germany
Abstract :
n-channel Si/SiGe MODFETs with quantum wells grown on a thick (1.5 mu m) graded buffer (Ge 5-30%) are realised. MODFETs with a surface gate work in the depletion mode due to a large gate-to-2-DEG channel distance of 75 nm. MODFETs with a recessed gate 10-15 nm above the channel exhibit enhancement mode operation with significantly high extrinsic transconductances of 340 mS/mm or 670 mS/mm at 300 K or 77 K and corresponding intrinsic transconductances of 380 mS/mm or 800 mS/mm. The performance indicates the improved layer quality on graded buffers.
Keywords :
Ge-Si alloys; elemental semiconductors; high electron mobility transistors; semiconductor materials; semiconductor quantum wells; silicon; 340 to 800 mS; 77 to 300 K; MODFET; Si-SiGe; enhancement mode operation; extrinsic transconductances; graded buffer; intrinsic transconductance; n-channel; quantum wells; recessed gate;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19920100