Integrated optical E-field probes with segmented modulator electrodes

Author

Meier, Thomas ; Kostrzewa, Carsten ; Petermann, Klaus ; Schüppert, Bernd

Author_Institution

Inst. fur Hochfrequenztech., Tech. Univ. Berlin, Germany

Volume

12

Issue

8

fYear

1994

fDate

8/1/1994 12:00:00 AM

Firstpage

1497

Lastpage

1503

Abstract

Integrated optical E-field sensors using a Ti:LiNbO₃ Mach-Zehnder interferometer with a combined antenna and modulator electrode structure yielding a small size (12×3×2 mm³ or 30×3×2 mm³ for higher sensitivity, respectively) are presented. Segmented electrodes are used, yielding a sensitivity improvement of 10-20 dB compared to conventional electrodes, reduced signal fluctuations due to changing dielectric properties of the surrounding material and less field distortions. The experimentally obtained frequency response of our devices is flat up to f≈3 GHz. At 1 mW optical input power a sensitivity limit of E_min=1 mV/m at 1 Hz bandwidth has been measured. Using a transparent ITO (indium-tin oxide) electrode without a SiO₂-buffer layer and with an additionally evaporated 100 nm-layer of amorphous Si, we have obtained a thermal stabilization of the field probes

Keywords

dipole antennas; electric field measurement; electric fields; electro-optical devices; electrodes; integrated optics; light interferometers; lithium compounds; optical modulation; optical sensors; titanium; 1 Hz; 1 mW; 100 nm; 3 GHz; ITO; InSnO; LiNbO₃:Ti; SiO₂; SiO₂-buffer layer; Ti:LiNbO₃ Mach-Zehnder interferometer; amorphous Si; antenna; dielectric properties; field probes; frequency response; higher sensitivity; integrated optical E-field probes; integrated optical E-field sensors; integrated optics; less field distortions; modulator electrode structure; optical input power; segmented electrodes; segmented modulator electrodes; sensitivity improvement; sensitivity limit; signal fluctuations; small size; thermal stabilization; transparent; Dielectric materials; Electrodes; Fluctuations; Integrated optics; Optical distortion; Optical interferometry; Optical materials; Optical modulation; Optical sensors; Probes;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.317540

Filename

317540