Title :
Transistorized Phase-Comparison Relaying: Application and Tests
Author :
Horowitz, S.H. ; McConnell, A.J. ; Seeley, H.T.
fDate :
4/1/1960 12:00:00 AM
Keywords :
Circuit faults; Circuit testing; Fault currents; P-n junctions; Production facilities; Protection; Protective relaying; Relays; Transistors; Transmission line theory;
Journal_Title :
Power Apparatus and Systems, Part III. Transactions of the American Institute of Electrical Engineers
DOI :
10.1109/AIEEPAS.1960.4500776
