Title :
Extended Dynamic Range From a Combined Linear-Logarithmic CMOS Image Sensor
Author :
Storm, Graeme ; Henderson, Robert ; Hurwitz, J.E.D. ; Renshaw, David ; Findlater, Keith ; Purcell, Matthew
Author_Institution :
Imaging Div., STMi- croelectronics, Edinburgh
Abstract :
A CMOS image sensor that can operate in both linear and logarithmic mode is described. Two sets of data are acquired and combined in the readout path to render a high dynamic range image. This is accomplished in real-time without the use of frame memory. A dynamic range in excess of 120 dB was achieved at 26 frames/s (352times288-array). The system addresses the problems of high fixed pattern noise (FPN), slow response time, and low signal-to-noise ratio (SNR) in logarithmic mode. FPN has been effectively reduced by single and two parameter calibration, the latter achieving FPN of 2% per decade. A novel on-chip method of deriving a reference point has been implemented. The system is fabricated in a 0.18-mum 1P4M process and achieves a pixel pitch of 5.6 mum with 7 transistors per pixel
Keywords :
CMOS image sensors; integrated circuit noise; 0.18 micron; 5.6 micron; CMOS image sensor; fixed pattern noise; high dynamic range image; linear-logarithmic image sensor; on-chip method; signal-to-noise ratio; CMOS image sensors; Dynamic range; Image sensors; Layout; Lighting; Optical arrays; Pixel; Signal to noise ratio; Storms; Voltage; CMOS images; dynamic range; fixed pattern noise; image sensors; linear-logarithmic response; pixel architecture;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2006.880613