Title :
Optimal thresholds for multiwavelet shrinkage
Author :
Hsung, Tai-Chiu ; Lun, D. Pak-Kong
Author_Institution :
Centre for Multimedia Signal Process., Hong Kong Polytech. Univ., China
fDate :
3/6/2003 12:00:00 AM
Abstract :
Optimal threshold selection for multiwavelet denoising using multivariate shrinkage is considered. Unlike other risk estimators which are derived for a single threshold, a new risk estimator is proposed for each decomposition level based on the principle of Stein´s unbiased risk estimator.
Keywords :
discrete systems; estimation theory; mean square error methods; signal denoising; wavelet transforms; Stein´s unbiased estimator; decomposition level; multivariate shrinkage; multiwavelet denoising; multiwavelet shrinkage; optimal thresholds; risk estimator; unknown deterministic discrete signal;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20030328
