Title :
Reliability Test for 500 kV Gis
Author :
Terasaka, K. ; Aoyagi, H. ; Kamata, I. ; Ohyama, S. ; Tanaka, M.
Author_Institution :
Toshiba Corporation
fDate :
7/1/1982 12:00:00 AM
Abstract :
This paper describes the reliability tests performed when manufacturing the 500 kV GIS. It contains the results of measuring tests for induced surge to the GIS low-voltage control circuit and measuring tests for induced current to the GIS external grounding structure. The paper proposes the methods for suppressing the induced surge and for setting the induced current circuit.
Keywords :
Circuit testing; Geographic Information Systems; Grounding; Insulation testing; Performance evaluation; Pulp manufacturing; Surges; Switches; System testing; Voltage;
Journal_Title :
Power Apparatus and Systems, IEEE Transactions on
DOI :
10.1109/TPAS.1982.317436
