DocumentCode :
1167557
Title :
A 30 Year Retrospective on Dennard's MOSFET Scaling Paper
Author :
Bohr, Mark
Author_Institution :
Intel Corporation, mark.bohr@intel.com
Volume :
12
Issue :
1
fYear :
2007
Firstpage :
11
Lastpage :
13
Abstract :
The MOSFET scaling principles for obtaining simultaneous improvements in transistor density, switching speed, and power dissipation described by Robert H. Dennard and others in "Design of Ion-implanted MOSFETs with Very Small Physical Dimensions" (1974 ) became a roadmap for the semiconductor industry to provide systematic and predictable transistor improvements. New technology generations emerging approximately every three years during the 1970\´s and 1980\´s and appearing every other year starting in the mid-1990\´s, promise to continue although we face growing challenges.
Keywords :
Industries; Integrated circuit interconnections; Logic gates; MOSFET circuits; Silicon; Transistors; Voltage control;
fLanguage :
English
Journal_Title :
Solid-State Circuits Society Newsletter, IEEE
Publisher :
ieee
ISSN :
1098-4232
Type :
jour
DOI :
10.1109/N-SSC.2007.4785534
Filename :
4785534
Link To Document :
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