• DocumentCode
    1167911
  • Title

    Electrical Tracking Resistance of Polymers

  • Author

    Sommerman, G.M.L.

  • Volume
    79
  • Issue
    3
  • fYear
    1960
  • fDate
    4/1/1960 12:00:00 AM
  • Firstpage
    969
  • Lastpage
    974
  • Abstract
    The "standard" dust-fog test methods (Table I), although complex and time consuming, give sufficient repeatability of results (see appendix) to pennit comparative evaluation of the track resistance of materials over a very wide quality range (0.4-3,000 hours). This is apparently a much greater quality range than can be measured with the best drop-test methods standardized elsewhere. 4,12 A revrised form of the dust-fog test provides a much greater rate of degradation of enhancing tracking tendencies; also, the rate of degradation is less time-dependent compared with the "standard" tests. Both tests give results that may be correlated with the chemical structure and filler content of polymers; also both tests give results that correlate with the results of ASTM D495 arc-resistance tests for many unfilled and hydrated mineral-filled polymers. The D495 test may be employed to detect some wet-track susceptible materials and to predict the optimum contents of hydrated fillers used to improve the wet-track resistance of many types of polymers that do not contain too high a proportion of phenyl rings, chlorine together with hydrogen, or amine and amide groups in their structures. A short-time screening test is still needed for materials for which the dust-fog life is greater than 10 hours (International Electrochemical Commission tracking indexes greater than 1,000 volts). The use of diagnostic techniques (pH indicators, etc.) is informative.
  • Keywords
    Character generation; Electric resistance; Equations; Impedance; Insulation life; Polymers; Reactive power; Surface resistance; Testing; Voltage;
  • fLanguage
    English
  • Journal_Title
    Power Apparatus and Systems, Part III. Transactions of the American Institute of Electrical Engineers
  • Publisher
    ieee
  • ISSN
    0097-2460
  • Type

    jour

  • DOI
    10.1109/AIEEPAS.1960.4500893
  • Filename
    4500893