Title :
Testing and Qualifying Linear Integrated Circuits for Radiation Degradation in Space
Author :
Johnston, Allan H. ; Rax, Bernard G.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
Abstract :
This paper discusses mechanisms and circuit-related factors that affect the degradation of linear integrated circuits from radiation in space. For some circuits there is sufficient degradation to affect performance at total dose levels below 4 krad(Si) because the circuit design techniques require higher gain for the pnp transistors that are the most sensitive to radiation. Qualification methods are recommended that include displacement damage as well as ionization damage
Keywords :
integrated circuit design; integrated circuit testing; radiation effects; space vehicle electronics; circuit-related factors; linear integrated circuit; pnp transistor; qualification method; space radiation effects; Analog integrated circuits; Circuit synthesis; Circuit testing; Degradation; Earth; Instruments; Integrated circuit testing; Ionizing radiation; Qualifications; Regulators; Hardness assurance; linear integrated circuits; radiation testing; space radiation;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2006.878291
