Title :
Memories Response to MBU and Semi-Empirical Approach for SEE Rate Calculation
Author :
Petit, S. ; David, J.P. ; Falguère, D. ; Duzellier, S. ; Inguimbert, C. ; Nuns, T. ; Ecoffet, R.
Author_Institution :
ONERA-DESP, Toulouse
Abstract :
This paper deals with SEE rate prediction and proposes a semi-empirical approach that makes no use of the RPP concept. The investigation is based on a reduced set of ground data and SEU/MBU results are compared with in-flight data obtained on memories on-board ICARE (SAC-C orbit). Two-dimensional mixed-mode simulations complete this study and provide first insight to understand the observed behavior
Keywords :
ion beam effects; random-access storage; MBU; RAM; RPP concept; SEE; heavy ion rate; in-flight data; memories on-board ICARE; multiple bit upset; semiempirical approach; two-dimensional mixed-mode simulation; Belts; Charge measurement; Current measurement; Data analysis; Extraterrestrial measurements; Filtering; Geometry; Ionization; Protons; Testing; Predictions; SEU; multiple bit upset (MBU);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2006.872153
