Laser-Induced Latchup Screening and Mitigation in CMOS Devices

Author

McMorrow, Dale ; Buchner, Stephen ; Baze, Mark ; Bartholet, Bill ; Katz, Richard ; Bryan, Martha O. ; Poivey, Christian ; LaBel, Kenneth A. ; Ladbury, Ray ; Maher, Mike ; Sexton, Fred W.

Author_Institution

Naval Res. Lab., Washington, DC

Volume

53

Issue

4

fYear

2006

Firstpage

1819

Lastpage

1824

Abstract

The application of the pulsed laser approach for identifying latch-up sensitive regions in CMOS circuitry is described. The utility of this approach for preliminary latchup screening of both COTS and space-qualified parts for applications in radiation environments is described. An application of hardening-by-design principles in which a space-qualified CMOS product is modified, based on the pulsed laser results, to be latchup immune, is presented in detail. The design modifications are described

Keywords

CMOS integrated circuits; integrated circuit design; laser beam applications; software packages; CMOS circuitry; COTS; hardening-by-design principles; laser-induced latchup screening; pulsed laser approach; radiation environments; space-qualified CMOS product; Integrated circuit interconnections; Laboratories; Laser theory; NASA; Optical pulses; Pulse circuits; Pulsed laser deposition; Radiation hardening; Space technology; Switches; CMOS; laser; latchup; micro-latchup; picosecond; single-event effects; single-event latchup (SEL);

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2006.880929

Filename

1684023