Title :
Laser-Induced Latchup Screening and Mitigation in CMOS Devices
Author :
McMorrow, Dale ; Buchner, Stephen ; Baze, Mark ; Bartholet, Bill ; Katz, Richard ; Bryan, Martha O. ; Poivey, Christian ; LaBel, Kenneth A. ; Ladbury, Ray ; Maher, Mike ; Sexton, Fred W.
Author_Institution :
Naval Res. Lab., Washington, DC
Abstract :
The application of the pulsed laser approach for identifying latch-up sensitive regions in CMOS circuitry is described. The utility of this approach for preliminary latchup screening of both COTS and space-qualified parts for applications in radiation environments is described. An application of hardening-by-design principles in which a space-qualified CMOS product is modified, based on the pulsed laser results, to be latchup immune, is presented in detail. The design modifications are described
Keywords :
CMOS integrated circuits; integrated circuit design; laser beam applications; software packages; CMOS circuitry; COTS; hardening-by-design principles; laser-induced latchup screening; pulsed laser approach; radiation environments; space-qualified CMOS product; Integrated circuit interconnections; Laboratories; Laser theory; NASA; Optical pulses; Pulse circuits; Pulsed laser deposition; Radiation hardening; Space technology; Switches; CMOS; laser; latchup; micro-latchup; picosecond; single-event effects; single-event latchup (SEL);
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2006.880929
