Title :
DASIE Analytical Version: A Predictive Tool for Neutrons, Protons and Heavy Ions Induced SEU Cross Section
Author :
Weulersse, C. ; Hubert, G. ; Forget, G. ; Buard, N. ; Carrière, T. ; Heins, P. ; Palau, J.M. ; Saigné, F. ; Gaillard, R.
Author_Institution :
Corporate Res. Center, Eur. Aeronaut. Defence & Space Co., Suresnes
Abstract :
This paper presents the new detailed analysis of the secondary ion effect analytical version that allows fast and accurate calculation of neutron, proton and heavy ion cross sections in SRAM based memories. The advantage of this new version is a better determination of the input parameters using heavy ion data. A validation is presented by comparing simulation results with experimental data for technology from 600 to 180-nm
Keywords :
SRAM chips; neutron effects; proton effects; space vehicle electronics; 600 to 180 nm; DASIE analytical version; SEU cross section; SRAM based memory; heavy ions; neutrons; predictive tool; protons; secondary ion effect; static random-access memory; Aerospace electronics; Analytical models; Databases; Flowcharts; Geometry; Neutrons; Protons; Random access memory; Silicon; Single event upset; Cross section prediction; SEU; SRAM;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2006.880947
