• DocumentCode
    1168139
  • Title

    Thermal Limits of Transrormers for Short-Circuit Conditions AIEE Committee Report

  • Volume
    79
  • Issue
    3
  • fYear
    1960
  • fDate
    4/1/1960 12:00:00 AM
  • Firstpage
    1083
  • Lastpage
    1086
  • Keywords
    Capacitance; Circuit testing; Electric breakdown; Electrons; Instruments; Insulation; Ionization; Oscillators; Temperature; Voltage;
  • fLanguage
    English
  • Journal_Title
    Power Apparatus and Systems, Part III. Transactions of the American Institute of Electrical Engineers
  • Publisher
    ieee
  • ISSN
    0097-2460
  • Type

    jour

  • DOI
    10.1109/AIEEPAS.1960.4500916
  • Filename
    4500916