Title :
Thermal Limits of Transrormers for Short-Circuit Conditions AIEE Committee Report
fDate :
4/1/1960 12:00:00 AM
Keywords :
Capacitance; Circuit testing; Electric breakdown; Electrons; Instruments; Insulation; Ionization; Oscillators; Temperature; Voltage;
Journal_Title :
Power Apparatus and Systems, Part III. Transactions of the American Institute of Electrical Engineers
DOI :
10.1109/AIEEPAS.1960.4500916
