DocumentCode
1168923
Title
DRAM – A Personal View
Author
Foss, R.C.
Author_Institution
Mosaid Technologies, Inc.
Volume
13
Issue
1
fYear
2008
Firstpage
50
Lastpage
56
Abstract
Based on his work in the design, specification and test of DRAM for over thirty years, Dr. Richard Foss charts the crucial role of Dynamic Random Access Memory in the intertwined development of the computer and semiconductor industries, and highlights the influence of Moore´s Law, whose tentacles reach into every aspect of modern life.
Keywords
CMOS integrated circuits; Companies; Random access memory; SDRAM; Substrates; Temperature sensors; Transistors;
fLanguage
English
Journal_Title
Solid-State Circuits Society Newsletter, IEEE
Publisher
ieee
ISSN
1098-4232
Type
jour
DOI
10.1109/N-SSC.2008.4785693
Filename
4785693
Link To Document