DocumentCode
1169044
Title
VLSI-TSA and VLSI-DAT to Convene on 21–25 April in Hsinchu, Taiwan, 15th International Symposium on VLSI Technology, Systems, and Applications & 4th VLSI Design, Automation and Test
Author
Wu, Clara
Author_Institution
Symposia Secretariat, clara@itri.org.tw
Volume
13
Issue
1
fYear
2008
Firstpage
69
Lastpage
69
Abstract
15th International Symposium on VLSI Technology, Systems, and Applications & 4th VLSI Design, Automation and Test Divided into two separate annual symposia since 2005, VLSI TSA-DAT lasts for two and a half days in the same week, with a one day overlap. In 2008 each symposium will feature three keynote speakers. The aim of the joint conference is to bring together scientists and engineers actively engaged in research, development, and manufacturing on VLSI technology, systems, and applications and on VLSI design, automation and test to discuss current progress in this field.
fLanguage
English
Journal_Title
Solid-State Circuits Society Newsletter, IEEE
Publisher
ieee
ISSN
1098-4232
Type
jour
DOI
10.1109/N-SSC.2008.4785705
Filename
4785705
Link To Document