• DocumentCode
    1169170
  • Title

    Predicted performance of Franz-Keldysh effect optical reflection modulators and comparisons with similar multiple quantum well-based devices

  • Author

    Leeson, M.S. ; Payne, F.P.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Manchester Metropolitan Univ., UK
  • Volume
    141
  • Issue
    4
  • fYear
    1994
  • fDate
    8/1/1994 12:00:00 AM
  • Firstpage
    257
  • Lastpage
    264
  • Abstract
    In the paper the electroabsorption and electrorefraction spectra are calculated for GaAs, InGaAsP and InGaAs. These are compared both with experimental results and data from the literature giving very good agreement. From these calculations the behaviour of simple reflection modulators operating at 885 nm, 1.32 μm and 1.76 μm is quantified for a 3 dB insertion loss. This produces contrasts (on:off) of approximately 3 dB at -30 V bias for all three semiconductors above. By using a Fabry-Perot cavity formed by the end faces of the modulator devices these contrasts are shown to increase to 20 dB for GaAs and InGaAsP, and 6.9 dB for InGaAs at the same bias. This potential performance is compared to multiple quantum well devices which also make use of cavity effects
  • Keywords
    electro-optical devices; electroabsorption; integrated optics; optical modulation; optical resonators; reflectivity; semiconductor quantum wells; 1.32 mum; 1.76 mum; 3 dB; 885 nm; Fabry-Perot cavity; Franz-Keldysh effect optical reflection modulators; GaAs; InGaAs; InGaAsP; cavity effect; electroabsorption; electrorefraction spectra; end faces; insertion loss; multiple quantum well devices; multiple quantum well-based devices; reflection modulators; semiconductors;
  • fLanguage
    English
  • Journal_Title
    Optoelectronics, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2433
  • Type

    jour

  • DOI
    10.1049/ip-opt:19941175
  • Filename
    318012