Title :
All-optical bit-error monitoring system using cascaded inverted wavelength converter and optical NOR gate
Author :
Chan, L.Y. ; Qureshi, K.K. ; Wai, P.K.A. ; Moses, B. ; Lui, L. F K ; Tam, H.Y. ; Demokan, M.S.
Author_Institution :
Photonics Res. Center, Hong Kong Polytech. Univ., China
fDate :
4/1/2003 12:00:00 AM
Abstract :
A novel all-optical bit-error monitoring system is demonstrated by cascading two all-optical logic gates: an inverted wavelength converter and an optical NOR gate which are realized using injection-locked laser diodes operating at different thresholds. Real-time optical monitoring signal is generated which indicates the positions and duration of both bit and burst errors in 10-Gb/s nonreturn-to-zero signals.
Keywords :
laser mode locking; monitoring; optical fibre communication; optical fibre testing; optical logic; optical wavelength conversion; semiconductor lasers; telecommunication network reliability; 10 Gbit/s; all-optical bit-error monitoring system; all-optical logic gates; burst errors; cascaded inverted wavelength converter; injection-locked laser diodes; inverted wavelength converter; nonreturn-to-zero signals; optical NOR gate; real-time optical monitoring signal; Diode lasers; High speed optical techniques; Logic gates; Monitoring; Optical attenuators; Optical fiber networks; Optical signal processing; Optical wavelength conversion; Signal generators; Signal processing;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2003.809298
