Title :
Form birefringence phase matching in multilayer semiconductor waveguides: tuning and tolerances
Author :
De Rossi, Alfredo ; Berger, Vincent ; Leo, Giuseppe ; Assanto, Gaetano
Author_Institution :
Thales Res. & Technol., Orsay, France
Abstract :
GaAs-Alox waveguide structures for parametric processes are analyzed in detail. The geometric tolerances of the structure are numerically calculated with reference to its parametric tuning. Finally, the tunability of GaAs-Alox based parametric devices versus temperature is investigated.
Keywords :
III-V semiconductors; birefringence; gallium arsenide; optical multilayers; optical parametric devices; optical phase matching; optical tuning; optical waveguides; GaAs; GaAs-Alox waveguide; form birefringence; geometric tolerances; multilayer waveguides; parametric tuning; phase matching; Birefringence; Frequency conversion; Laser tuning; Nonhomogeneous media; Nonlinear optics; Optical harmonic generation; Optical pumping; Optical refraction; Optical waveguides; Semiconductor waveguides; Nonlinear optics; optical waveguides; phase matching; semiconductor waveguides;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.2005.854133
