DocumentCode :
1169528
Title :
Measurement of thermooptic coefficients dnE/dT and dnO/dT of AgGaS2 at 308 and 97 K
Author :
Aggarwal, Roshan L. ; Fan, Tso Yee
Author_Institution :
MIT Lincoln Lab., Lexington, MA, USA
Volume :
41
Issue :
10
fYear :
2005
Firstpage :
1319
Lastpage :
1322
Abstract :
Thermooptic coefficients (dnE/dT and dnO/dT) of AgGaS2 have been measured at temperatures of ∼308 and 97 K, using temperature-induced shift in the frequency of the interference fringes in the Fourier transform infrared (FTIR) transmittance spectrum of a 2-mm-thick etalon. Values of dnE/dT and dnO/dT are reported for the spectral regime from 12.4 μm to 1.06 μm; the subscripts E and O refer to extraordinary and ordinary rays, respectively. Our values of dnE/dT and dnO/dT at 308 K are significantly lower (∼1/3) than those reported previously.
Keywords :
Fourier transform spectra; infrared spectra; nonlinear optics; optical materials; optical variables measurement; silver compounds; thermo-optical effects; 12.4 to 1.06 mum; 2 mm; 308 K; 97 K; AgGaS2; Fourier transform infrared transmittance spectrum; etalon; temperature-induced shift; thermooptic coefficients; Birefringence; Frequency measurement; Nonlinear optics; Optical frequency conversion; Optical materials; Optical refraction; Particle measurements; Phase measurement; Temperature measurement; Thermal loading; Materials science and technology; nonlinear optics; optical refraction; phase matching;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2005.855023
Filename :
1510802
Link To Document :
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