• DocumentCode
    1169528
  • Title

    Measurement of thermooptic coefficients dnE/dT and dnO/dT of AgGaS2 at 308 and 97 K

  • Author

    Aggarwal, Roshan L. ; Fan, Tso Yee

  • Author_Institution
    MIT Lincoln Lab., Lexington, MA, USA
  • Volume
    41
  • Issue
    10
  • fYear
    2005
  • Firstpage
    1319
  • Lastpage
    1322
  • Abstract
    Thermooptic coefficients (dnE/dT and dnO/dT) of AgGaS2 have been measured at temperatures of ∼308 and 97 K, using temperature-induced shift in the frequency of the interference fringes in the Fourier transform infrared (FTIR) transmittance spectrum of a 2-mm-thick etalon. Values of dnE/dT and dnO/dT are reported for the spectral regime from 12.4 μm to 1.06 μm; the subscripts E and O refer to extraordinary and ordinary rays, respectively. Our values of dnE/dT and dnO/dT at 308 K are significantly lower (∼1/3) than those reported previously.
  • Keywords
    Fourier transform spectra; infrared spectra; nonlinear optics; optical materials; optical variables measurement; silver compounds; thermo-optical effects; 12.4 to 1.06 mum; 2 mm; 308 K; 97 K; AgGaS2; Fourier transform infrared transmittance spectrum; etalon; temperature-induced shift; thermooptic coefficients; Birefringence; Frequency measurement; Nonlinear optics; Optical frequency conversion; Optical materials; Optical refraction; Particle measurements; Phase measurement; Temperature measurement; Thermal loading; Materials science and technology; nonlinear optics; optical refraction; phase matching;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2005.855023
  • Filename
    1510802