• DocumentCode
    1169868
  • Title

    A high-speed oscillator-based truly random number source for cryptographic applications on a smart card IC

  • Author

    Bucci, Marco ; Germani, Lucia ; Luzzi, Raimondo ; Trifiletti, Alessandro ; Varanonuovo, Mario

  • Author_Institution
    Rome Crypto Design Center, Gemplus S.A, Rome, Italy
  • Volume
    52
  • Issue
    4
  • fYear
    2003
  • fDate
    4/1/2003 12:00:00 AM
  • Firstpage
    403
  • Lastpage
    409
  • Abstract
    The design of a high-speed IC random number source macro-cell, suitable for integration in a smart card microcontroller, is presented. The oscillator sampling technique is exploited and a jittered oscillator which features an amplified thermal noise source has been designed in order to increase the output throughput and the statistical quality of the generated bit sequences. The oscillator feedback loop acts as an offset compensation for the noise amplifier, thus solving one of the major issues in this kind of circuit. A numerical model for the proposed system has been developed which allows us to carry out an analytical expression for the transition probability between successive bits in the output stream. A prototype chip has been fabricated in a standard digital 0.18 μm n-well CMOS process which features a 10 Mbps throughput and fulfills the NIST FIPS and correlation-based tests for randomness. The macro-cell area, excluding pads, is 0.0016 mm2 (184 μm × 86 μm) and a 2.3 mW power consumption has been measured.
  • Keywords
    CMOS integrated circuits; cryptography; integrated circuit noise; integrated logic circuits; jitter; low-power electronics; microcontrollers; oscillators; random number generation; smart cards; 0.18 micron; 10 Mbit/s; 184 micron; 2.3 mW; 86 micron; CMOS process; NIST FIPS tests; amplified thermal noise source; correlation-based tests; cryptographic applications; generated bit sequences; high-speed IC random number source macro-cell; high-speed oscillator-based truly random number source; jittered oscillator; macro-cell area; noise amplifier; numerical model; offset compensation; oscillator feedback loop; oscillator sampling technique; output throughput; power consumption; randomness; smart card IC; smart card microcontroller; statistical quality; transition probability; Application specific integrated circuits; Cryptography; High speed integrated circuits; Integrated circuit noise; Microcontrollers; Noise generators; Oscillators; Sampling methods; Smart cards; Throughput;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/TC.2003.1190581
  • Filename
    1190581