DocumentCode :
1170055
Title :
A 1.8-V 128-Mb mobile DRAM with double boosting pump, hybrid current sense amplifier, and dual-referenced adjustment scheme for temperature sensor
Author :
Sim, Jae-Yoon ; Yoon, Hongil ; Chun, Ki-Chul ; Lee, Hyun-Seok ; Hong, Sang-Pyo ; Lee, Kyu-Chan ; Yoo, Jei-Hwan ; Seo, Dong-I ; Cho, Soo-In
Author_Institution :
Memory Div., Samsung Electron. Co. Ltd., Kyunggi-Do, South Korea
Volume :
38
Issue :
4
fYear :
2003
fDate :
4/1/2003 12:00:00 AM
Firstpage :
631
Lastpage :
640
Abstract :
To verify three important circuit schemes suitable for DRAMs in mobile applications, a 1.8-V 128-Mb SDRAM was implemented with a 0.15-μm technology. To achieve an ideal 33% efficiency, the double boosting pump uses two capacitor´s series connection at pumping phase, while they are precharged in parallel. The hybrid folded current sense amplifier together with a novel replica inverter connection improved power and speed performances. Also, a dual-referenced adjustment scheme for a temperature sensor was proposed to allow a very high accuracy in tuning. Without loss in productivity, the implemented dual-referenced searching technique achieved tuning error of less than ±2.5°C.
Keywords :
CMOS memory circuits; DRAM chips; application specific integrated circuits; circuit tuning; low-power electronics; temperature sensors; 0.15 micron; 1.8 V; 128 Mbit; 33 percent; SDRAM; double boosting pump; dual-referenced adjustment scheme; hybrid current sense amplifier; mobile applications; replica inverter connection; temperature sensor; tuning error; Boosting; Circuit testing; Degradation; Low voltage; Mobile computing; Multiaccess communication; Random access memory; SDRAM; Temperature sensors; Threshold voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2003.809514
Filename :
1190599
Link To Document :
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