DocumentCode :
1170348
Title :
New electron-probe instruments
Author :
Oatley, C.W.
Volume :
12
Issue :
8
fYear :
1966
fDate :
8/1/1966 12:00:00 AM
Firstpage :
282
Lastpage :
285
Abstract :
Details of the construction and mode of operation of the scanning electron microscope, the scanning electron diffractometer and the mirror electron microscope have recently been published elsewhere; in this article, the emphasis is on their uses and advantages.
Keywords :
electron beams; measurement by electrical methods;
fLanguage :
English
Journal_Title :
Electronics and Power
Publisher :
iet
ISSN :
0013-5127
Type :
jour
DOI :
10.1049/ep.1966.0212
Filename :
5177997
Link To Document :
بازگشت