• DocumentCode
    1170714
  • Title

    A new backscattering model giving a description of the quasi-ballistic transport in nano-MOSFET

  • Author

    Fuchs, Emmanuel ; Dollfus, Philippe ; Le Carval, Gilles ; Barraud, Sylvain ; Villanueva, Davy ; Salvetti, Frederic ; Jaouen, Hervé ; Skotnicki, Thomas

  • Author_Institution
    STMicroelectron., Crolles, France
  • Volume
    52
  • Issue
    10
  • fYear
    2005
  • Firstpage
    2280
  • Lastpage
    2289
  • Abstract
    A backscattering model suitable for compact modeling of nanoscale MOSFET is developed within the Landauer flux-scattering theory. To describe the quasi-ballistic transport, a new backscattering model based on the accurate determination of ballistic and backscattering probabilities along the channel is developed. This model is based on a careful analysis of transport in device using Monte Carlo simulation. This model allows us to display the main physical quantities along the channel and to accurately describe the quasi-ballistic transport and its effects on current-voltage characteristics.
  • Keywords
    MOSFET; Monte Carlo methods; ballistic transport; nanoelectronics; semiconductor device models; Landauer flux scattering theory; Monte Carlo simulation; backscattering model; backscattering probability; ballistic probability; carrier transport; current-voltage characteristics; nanoMOSFET; quasiballistic transport; Backscatter; Ballistic transport; Current-voltage characteristics; Displays; Distribution functions; MOSFET circuits; Monte Carlo methods; Physics; Scattering; Spectroscopy; Carrier transport; MOSFET; compact model; quasi-ballistic;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2005.856181
  • Filename
    1510920