DocumentCode :
1170714
Title :
A new backscattering model giving a description of the quasi-ballistic transport in nano-MOSFET
Author :
Fuchs, Emmanuel ; Dollfus, Philippe ; Le Carval, Gilles ; Barraud, Sylvain ; Villanueva, Davy ; Salvetti, Frederic ; Jaouen, Hervé ; Skotnicki, Thomas
Author_Institution :
STMicroelectron., Crolles, France
Volume :
52
Issue :
10
fYear :
2005
Firstpage :
2280
Lastpage :
2289
Abstract :
A backscattering model suitable for compact modeling of nanoscale MOSFET is developed within the Landauer flux-scattering theory. To describe the quasi-ballistic transport, a new backscattering model based on the accurate determination of ballistic and backscattering probabilities along the channel is developed. This model is based on a careful analysis of transport in device using Monte Carlo simulation. This model allows us to display the main physical quantities along the channel and to accurately describe the quasi-ballistic transport and its effects on current-voltage characteristics.
Keywords :
MOSFET; Monte Carlo methods; ballistic transport; nanoelectronics; semiconductor device models; Landauer flux scattering theory; Monte Carlo simulation; backscattering model; backscattering probability; ballistic probability; carrier transport; current-voltage characteristics; nanoMOSFET; quasiballistic transport; Backscatter; Ballistic transport; Current-voltage characteristics; Displays; Distribution functions; MOSFET circuits; Monte Carlo methods; Physics; Scattering; Spectroscopy; Carrier transport; MOSFET; compact model; quasi-ballistic;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2005.856181
Filename :
1510920
Link To Document :
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