• DocumentCode
    1171029
  • Title

    FFT architecture for WSI with concurrent error detection and fault location

  • Author

    Lombardi, F. ; Shen, Y.-N. ; Muzio, J.

  • Author_Institution
    Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA
  • Volume
    139
  • Issue
    1
  • fYear
    1992
  • fDate
    1/1/1992 12:00:00 AM
  • Firstpage
    13
  • Lastpage
    20
  • Abstract
    The paper presents a new approach for concurrent error detection in homogeneous VLSI/WSI architectures for the computation of the complex N-point fast Fourier transform (FFT). The proposed approach is based on the relationship between the computations of cells at a given point distance. This relationship is analysed with respect to functional and physical faults. It is proved that a 100% probability of detection is possible. Overhead issues for hardware and timing are addressed. It is proved that hardware overhead is 50% compared to a fault intolerant complex 2-point implementation. Fault detection can be accommodated online and on a component basis (multiplier or adder/subtractor); full fault location is accomplished by a roving technique, which utilises a reconfiguration approach at no significant time overhead. The proposed technique can be accommodated efficiently in a homogeneous layout for WSI implementation. A two-phase reconfiguration policy for the proposed architecture is presented. It is proved that switching and routing overhead are modest, while achieving a significant reliability improvement over previous approaches.
  • Keywords
    VLSI; computerised signal processing; digital signal processing chips; error detection; fast Fourier transforms; fault location; FFT architecture; N-point fast Fourier transform; VLSI; WSI; concurrent error detection; fault location; functional faults; layout; physical faults; probability of detection; routing; roving technique; switching; timing;
  • fLanguage
    English
  • Journal_Title
    Computers and Digital Techniques, IEE Proceedings E
  • Publisher
    iet
  • ISSN
    0143-7062
  • Type

    jour

  • Filename
    119106