DocumentCode :
1171046
Title :
Monolithically integrated high-power broad-band RF switch based on III-N insulated gate transistors
Author :
Koudymov, A. ; Rai, S. ; Adivarahan, V. ; Gaevski, M. ; Yang, J. ; Simin, G. ; Khan, M.A.
Author_Institution :
Dept. of Electr. Eng., Univ. of South Carolina, Columbia, SC, USA
Volume :
14
Issue :
12
fYear :
2004
Firstpage :
560
Lastpage :
562
Abstract :
We report on the high-performance monolithically integrated RF switch based on metal-oxide-semiconductor III-N heterostructure field-effect transistors (MOSHFETs). The radio frequency (RF) switch microwave monolithic integrated circuit (MMIC) consists of three submicron-gate MOSHFETs connected into π-type configuration. In the 0-10 GHz frequency range, the insertion loss is less than 1dB and the isolation is better than 20 dB. The switching powers well exceed 20 W per 1mm of the active element width. The high performance parameters of the switch are achieved due to unique properties of III-nitride MOSHFET, which combines a low channel resistance and high breakdown voltage features of AlGaN/GaN HFETs and extremely low gate leakage currents, large gate voltage swing and low gate capacitance specific to insulated gate design. The combination of these parameters makes MOSHFETs excellent candidates for high-power switching. The experimental data obtained from the RF switch are in close agreement with the results of simulations.
Keywords :
III-V semiconductors; MMIC; MOS integrated circuits; MOSFET; aluminium compounds; gallium compounds; leakage currents; microswitches; microwave switches; 0 to 10 GHz; AlGaN-GaN; AlGaN/GaN HFET; HEMT; III-N insulated gate transistors; III-nitride MOSHFET; RF switch microwave monolithic integrated circuit; active element width; high breakdown voltage; high-power broad-band RF switch; high-power switching; insertion loss; insulated gate design; large gate voltage swing; low channel resistance; low gate capacitance; low gate leakage currents; metal-oxide-semiconductor III-N HFET; monolithically integrated RF switch; submicron-gate MOSHFET; Field effect MMICs; HEMTs; Insulation; MODFETs; MOSHFETs; Microwave transistors; Monolithic integrated circuits; Radio frequency; Switches; Switching circuits; 65; FET; Field-effect transistor; GaN; HEMT; HFET; MOSHFET; RF; heterostructure field-effect transistor; metal-oxide-semiconductor III-N heterostructure field-effect transistor; switch; wireless;
fLanguage :
English
Journal_Title :
Microwave and Wireless Components Letters, IEEE
Publisher :
ieee
ISSN :
1531-1309
Type :
jour
DOI :
10.1109/LMWC.2004.837381
Filename :
1362668
Link To Document :
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