DocumentCode
1171122
Title
Three-crystal X-ray scan simulation of superlattice structures using Abeles-Takagi dynamic approach
Author
Swaminathan, Sridhar
Volume
25
Issue
14
fYear
1989
fDate
7/6/1989 12:00:00 AM
Firstpage
933
Lastpage
934
Abstract
Computer simulation of the three-crystal X-ray scan of the
Keywords
III-V semiconductors; X-ray crystallography; X-ray diffraction examination of materials; digital simulation; gallium arsenide; indium compounds; semiconductor superlattices; Abeles´ matrix method; Abeles-Takagi dynamic approach; GaInAs-InP; Takagi-Taupin´s method; calculation of reflectivities; computer simulation; dynamic model; high resolution X-ray diffraction; semiconductor; superlattice periods; superlattice structures; three-crystal X-ray scan;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19890626
Filename
31949
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