DocumentCode :
1171168
Title :
Fault isolation via components simulation
Author :
Saeks, R. ; Singh, Sushil ; Liu, Ruey-wen
Volume :
19
Issue :
6
fYear :
1972
fDate :
11/1/1972 12:00:00 AM
Firstpage :
634
Lastpage :
640
Abstract :
The problem of deducing the internal component parameters from external measurements of a large-scale system is studied in the context of the fault isolation problem. By assuming an appropriate algebraic connection model matrix, algebraic necessary and sufficient conditions for the exact determination of the internal component parameters are obtained for both the single-test frequency and multiple-test frequency cases. In both cases the linear independence of the rows or columns of certain matrices may be used to determine appropriate test points and test frequencies.
Keywords :
Fault isolation, large-scale systems; General circuit theory; Interconnected systems; Active circuits; Circuit faults; Circuit testing; Electrical fault detection; Frequency; Helium; Integrated circuit technology; Large-scale systems; Matrices; System testing;
fLanguage :
English
Journal_Title :
Circuit Theory, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9324
Type :
jour
DOI :
10.1109/TCT.1972.1083560
Filename :
1083560
Link To Document :
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