Title :
Josephson latching driver with a low bit-error rate
Author :
Harada, Naoki ; Yoshikawa, Nobuyuki ; Yoshida, Akira ; Yokoyama, Naoki
Author_Institution :
Fujitsu Ltd., Atsugi, Japan
Abstract :
A new Josephson latching driver with a current-injection device at an input port has been developed and tested. It has high input sensitivity and a wide bias margin. Under an optimal bias condition, the bit-error rate (BER) of this driver is below 10-12 at data rates of 5 and 10 Gb/s. The driver can be switched by superconducting single-flux quantum (SFQ) pulse input and can be used as an amplifier to test the BER of SFQ circuits. In such a test, the BER of an SFQ converter operating at 5 Gb/s was less than 10-12 with bias margin of ±20%.
Keywords :
convertors; error statistics; superconducting junction devices; superconducting logic circuits; Josephson junctions; Josephson latching driver; Josephson logic; SFQ circuits; SFQ converter; bit-error rate; current-injection device; superconducting devices; superconducting single-flux quantum pulse input; Bit error rate; Circuit testing; Driver circuits; Josephson junctions; Pulse amplifiers; Signal to noise ratio; Superconducting logic circuits; Superconducting transmission lines; Switches; Voltage; 65; Josephson junctions; Josephson logic; superconducting devices;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2004.837112
