DocumentCode :
1171358
Title :
Trade-offs in cycle time management: hot lots
Author :
Ehteshami, Babak ; Pétrakian, Raja G. ; Shabe, Phyllis M.
Author_Institution :
Altera Corp., San Jose, CA, USA
Volume :
5
Issue :
2
fYear :
1992
fDate :
5/1/1992 12:00:00 AM
Firstpage :
101
Lastpage :
106
Abstract :
In manufacturing, higher priority is given to hot lots to reduce their cycle time. The impact of hot lots on the cycle time of other lots in the system is studied here. Object-oriented simulation experiments of a wafer fabrication model were run to investigate the above impact. The simulation results showed that as the proportion of hot lots in the work-in progress increases, both the average cycle time and the corresponding standard deviation for all other lots increase dramatically. Thus, it is argued that hot lots induce either a deterioration in service level for regular lots or an increase in inventory costs. Sound management accounting would require that these costs be estimated, possibly using an approach outlined here
Keywords :
integrated circuit manufacture; production control; scheduling; average cycle time; batch processing; cycle time management; cycle time of other lots; deterioration in service level; hot lots; inventory costs; management accounting; object oriented simulation experiments; priority lots; simulation results; standard deviation; wafer fabrication model; work-in progress; Batch production systems; Costs; Fabrication; Management accounting; Manufacturing; Object oriented modeling; Production facilities; Semiconductor device modeling; Shape; Workstations;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/66.136270
Filename :
136270
Link To Document :
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