Title :
Electron pulse generation at 64 GHz in scanning electron microscope
Author :
Thong, J.T.L. ; Breton, B.C. ; Nixon, W.C.
Author_Institution :
Cambridge Univ., UK
fDate :
7/20/1989 12:00:00 AM
Abstract :
An electron beam chopping technique has been developed which enables the generation of electron pulses at tens of GHz in an SEM. This is effected by deflecting the beam in a circle and chopping it with a multislot aperture. Electron pulses have been produced at 64 GHz and measured, and a waveform measurement at 18 GHz demonstrates its potential application to electron beam characterisation of very high speed devices and MMICs.
Keywords :
electron beam applications; integrated circuit testing; scanning electron microscopes; semiconductor device testing; 64 GHz; electron beam chopping technique; electron pulses; multislot aperture; scanning electron microscope; very high speed devices; waveform measurement;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19890654