Title : 
Electron pulse generation at 64 GHz in scanning electron microscope
         
        
            Author : 
Thong, J.T.L. ; Breton, B.C. ; Nixon, W.C.
         
        
            Author_Institution : 
Cambridge Univ., UK
         
        
        
        
        
            fDate : 
7/20/1989 12:00:00 AM
         
        
        
        
            Abstract : 
An electron beam chopping technique has been developed which enables the generation of electron pulses at tens of GHz in an SEM. This is effected by deflecting the beam in a circle and chopping it with a multislot aperture. Electron pulses have been produced at 64 GHz and measured, and a waveform measurement at 18 GHz demonstrates its potential application to electron beam characterisation of very high speed devices and MMICs.
         
        
            Keywords : 
electron beam applications; integrated circuit testing; scanning electron microscopes; semiconductor device testing; 64 GHz; electron beam chopping technique; electron pulses; multislot aperture; scanning electron microscope; very high speed devices; waveform measurement;
         
        
        
            Journal_Title : 
Electronics Letters
         
        
        
        
        
            DOI : 
10.1049/el:19890654