A new bidimensional histogram for the dynamic characterization of ADCs

A bidimensional histogram based on a dual-tone signal is proposed for testing analog-to-digital converters in the phase plane (output code, input signal slope). The bidimensional histogram of the actual code occurrences in the phase plane is compared with the ideal dual-tone probability distribution function in order to derive the actual transfer characteristic. With respect to the phase plane test via several single-tone acquisitions at different frequencies, the proposed histogram allows the phase plane coverage to be increased with the same sample number, the experimental burden to be reduced, and the metrological constraints of calibrators to be relaxed. Simulation and experimental results of characterization and validation highlight the effectiveness and the practical applicability in standardization of the proposed method.