DocumentCode
1171618
Title
Verification algorithms for VLSI synthesis
Author
Hachtel, Gary D. ; Jacoby, Reily M.
Author_Institution
Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA
Volume
7
Issue
5
fYear
1988
fDate
5/1/1988 12:00:00 AM
Firstpage
616
Lastpage
640
Abstract
A description is given of a theory for, and the application of, a general algorithm for determining whether a given multilevel Boolean function is a tautology or whether two given multilevel Boolean functions are equivalent. Four specific cases of this general algorithm are examined. These are termed the flattening method, the don´t-care method, the simulation method, and the algebraic string comparison method. A single unifying algorithm frame is given for the implementation of any of these four methods, depending on parameterization. Experimental results are given which indicate that, with the exception of the don´t-care method, each of these methods has a problem class in which it is clearly superior to the others. The primary application of these algorithms is as a verification tool for silicon compilation systems. However, these algorithms are also being used as the foundation for multilevel logic minimization and automatic test pattern generation programs
Keywords
Boolean functions; VLSI; automatic testing; circuit layout CAD; integrated circuit testing; logic CAD; logic testing; VLSI synthesis; algebraic string comparison; automatic test pattern generation; circuit layout CAD; flattening method; multilevel Boolean function; multilevel logic minimization; parameterization; simulation; tautology; verification tool; Automatic logic units; Automatic test pattern generation; Boolean functions; Circuit synthesis; Jacobian matrices; Logic functions; Logic testing; Minimization; Silicon; Very large scale integration;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.3200
Filename
3200
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