• DocumentCode
    1171672
  • Title

    Nonlinear parametric test

  • Author

    Teani, Carlos Roberto Negrão ; Jorge, Alberto Martins

  • Author_Institution
    Electron. & Microelectron. Dept., State Univ. of Campinas, Brazil
  • Volume
    52
  • Issue
    1
  • fYear
    2003
  • fDate
    2/1/2003 12:00:00 AM
  • Firstpage
    203
  • Lastpage
    208
  • Abstract
    Using the nonlinear behavior of the structural components within the integrated circuit, the state space may be studied, and one observable state trajectory can identify parametric variations through Poincare maps. An opamp parametric test, using the proposed methodology, is presented.
  • Keywords
    Poincare mapping; integrated circuit testing; state-space methods; virtual instrumentation; Poincare maps; integrated circuit test; nonlinear behavior; nonlinear parametric test; observable state trajectory; opamp; parametric variations; state space; structural components; virtual instrumentation; Circuit testing; Instruments; Integrated circuit manufacture; Integrated circuit testing; Nonlinear dynamical systems; Nonlinear systems; State-space methods; System testing; Time measurement; Trajectory;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2002.808024
  • Filename
    1191430
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1171672