Title :
Performance bounds for two-way amplify-and-forward relaying
Author :
Han, Yang ; Ting, See Ho ; Ho, Chin Keong ; Chin, Woon Hau
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
Abstract :
In this paper, the average sum rate of two-way amplify-and-forward (AF) half-duplex relaying system is analyzed. To this end, we first derive the harmonic mean of two independent gamma distributed random variables which have the same shape parameter but different scale parameters. By deriving tight upper and lower bounds for the average sum rate of two-way relaying, we verify that two-way relaying can significantly recover the spectrum efficiency loss of one-way relaying. We also extend the two-way AF half-duplex relaying to the case where source and destination terminals both transmit Alamouti´s orthogonal space time block code (OSTBC) utilizing two antennas and the relay has only one antenna. By deriving both upper and lower bounds for the average sum rate as well as an upper bound for the pairwise error probability (PEP) for the proposed two-way OSTBC scheme, we show that the average sum rate is further improved compared to the single antenna case and a diversity order of two is also achieved. Furthermore, optimal power allocations under a global power constraint for two-way relaying with single antenna and the proposed two-way OSTBC scheme are derived analytically.
Keywords :
block codes; diversity reception; error statistics; harmonic analysis; orthogonal codes; relays; space-time codes; Alamouti orthogonal space time block code; gamma distributed random variables; pairwise error probability; power allocations; single antenna; spectrum efficiency loss; two-way amplify-and-forward relaying; Block codes; Broadcasting; Decoding; Digital relays; Frequency; Pairwise error probability; Protocols; Random variables; Shape; Transmitting antennas; Two-way relaying; amplify-and-forward; harmonic mean; pairwise error probability; space time block code;
Journal_Title :
Wireless Communications, IEEE Transactions on
DOI :
10.1109/T-WC.2009.080316