Title :
A bridge circuit for the characterization of electrically programmable elements
Author :
Shacham-Diamand, Yosi ; Sinar, Alex ; Sirkin, Eric ; Blech, Ilan ; Gerzber, Levy
Author_Institution :
Dept. of electr. Eng., Technion Israel Inst. of Technol., Haifa, Israel
fDate :
6/1/1989 12:00:00 AM
Abstract :
A method for programming and characterizing electrically programmable elements of the antifuse type (i.e normally open) is described. The programming conditions are controlled by two transistors which isolate the programmable element (PEL) from the bias and common lines. The isolation from the external parasitic capacitance allows programming under conditions similar to that within a VLSI circuit. A parallel branch between the bias and common lines is added after programming to form a bridge structure. The PEL affects the symmetry of the bridge and its postprogramming electrical characteristics are measured indirectly after balancing the bridge. The operation of such circuit is demonstrated. A short discussion and some design consideration are also presented
Keywords :
PROM; bridge circuits; integrated memory circuits; antifuse type; bias line; bridge circuit; common lines; electrically programmable elements; external parasitic capacitance; normally open; postprogramming electrical characteristics; Bridge circuits; CMOS technology; Electric breakdown; Electric variables; Electric variables measurement; Parallel programming; Parasitic capacitance; Read only memory; Very large scale integration; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
