• DocumentCode
    1172137
  • Title

    Alternate metal virtual ground (AMG)-a new scaling concept for very high-density EPROMs

  • Author

    Eitan, Boaz ; Kazerounian, R. ; Bergemont, A.

  • Author_Institution
    Waferscale Integration Inc., Fremont, CA, USA
  • Volume
    12
  • Issue
    8
  • fYear
    1991
  • Firstpage
    450
  • Lastpage
    452
  • Abstract
    A new erasable programmable read-only memory (EPROM) array concept that reduces the cell size to the poly pitch in both directions is introduced. The key concepts that made the dramatic scaling possible are the virtual ground array with one metal line for every two diffusion bit lines, the segmentation of every other bit line, and the fieldless array. The cell size on 0.8- mu m technology is 2.56 mu m/sup 2/ and a 1- mu mm/sup 2/ cell is under development on a 0.5- mu m technology for the 64-Mb product. These cells are smaller by a factor of 2-3 than the standard EPROM cell on the same technology. The new array concept and its advantages are expandable to flash memories.<>
  • Keywords
    CMOS integrated circuits; EPROM; VLSI; integrated circuit technology; integrated memory circuits; 0.5 micron; 0.8 micron; 64 Mbit; CMOS; ULSI; alternate metal virtual ground; cell size; erasable programmable read-only memory; fieldless array; flash memories; high density EPROMs; metal line for every two diffusion bit lines; scaling concept; virtual ground array; EPROM; Flash memory; PROM; Read only memory; Split gate flash memory cells;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.119162
  • Filename
    119162