DocumentCode
1172137
Title
Alternate metal virtual ground (AMG)-a new scaling concept for very high-density EPROMs
Author
Eitan, Boaz ; Kazerounian, R. ; Bergemont, A.
Author_Institution
Waferscale Integration Inc., Fremont, CA, USA
Volume
12
Issue
8
fYear
1991
Firstpage
450
Lastpage
452
Abstract
A new erasable programmable read-only memory (EPROM) array concept that reduces the cell size to the poly pitch in both directions is introduced. The key concepts that made the dramatic scaling possible are the virtual ground array with one metal line for every two diffusion bit lines, the segmentation of every other bit line, and the fieldless array. The cell size on 0.8- mu m technology is 2.56 mu m/sup 2/ and a 1- mu mm/sup 2/ cell is under development on a 0.5- mu m technology for the 64-Mb product. These cells are smaller by a factor of 2-3 than the standard EPROM cell on the same technology. The new array concept and its advantages are expandable to flash memories.<>
Keywords
CMOS integrated circuits; EPROM; VLSI; integrated circuit technology; integrated memory circuits; 0.5 micron; 0.8 micron; 64 Mbit; CMOS; ULSI; alternate metal virtual ground; cell size; erasable programmable read-only memory; fieldless array; flash memories; high density EPROMs; metal line for every two diffusion bit lines; scaling concept; virtual ground array; EPROM; Flash memory; PROM; Read only memory; Split gate flash memory cells;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/55.119162
Filename
119162
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