• DocumentCode
    1172327
  • Title

    Estimating the time-delay and frequency decay parameter of scattering components using a modified MUSIC algorithm

  • Author

    Moghaddar, Ali ; Ogawa, Yasutaka ; Walton, Eric K.

  • Author_Institution
    ElectroSci. Lab., Ohio State Univ., Columbus, OH, USA
  • Volume
    42
  • Issue
    10
  • fYear
    1994
  • fDate
    10/1/1994 12:00:00 AM
  • Firstpage
    1412
  • Lastpage
    1418
  • Abstract
    A superresolution technique to determine the time-delay and frequency response of individual components of electromagnetic scattering is presented. A modification of the MUltiple SIgnal Classification (MUSIC) algorithm is proposed for the data model which includes scattering components with frequency dependent amplitudes. The modified technique is based on pre-multiplying the scattering data by the inverse of an assumed frequency dependence parameterized by a variable α. Estimates of α are then obtained by considering the roots of the root-MUSIC polynomial for various α. The algorithm is tested for simulated and experimental compact range data. For the example of measured scattering from a diagonal flat plate, different decay parameters corresponding to the single and double diffraction components are determined using the new algorithm
  • Keywords
    delays; electromagnetic wave diffraction; electromagnetic wave scattering; parameter estimation; polynomials; MUltiple SIgnal Classification; compact range data; data mode; diagonal flat plate; double diffraction; frequency decay parameter; frequency dependent amplitudes; modified MUSIC algorithm; root-MUSIC polynomial; scattering components; single diffraction; superresolution technique; time-delay; Classification algorithms; Data models; Electromagnetic scattering; Frequency dependence; Frequency estimation; Frequency response; Multiple signal classification; Polynomials; Scattering parameters; Signal resolution;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.320748
  • Filename
    320748