DocumentCode :
1172367
Title :
Micromechanical modeling of stress evolution induced during cure in a particle-filled electronic packaging polymer
Author :
Yang, Daoguo ; Jansen, K.M.B. ; Wang, L.G. ; Ernst, L.J. ; Zhang, G.Q. ; Bressers, H.J.L. ; Fan, Xuejun
Author_Institution :
Eng. Mech. Group, Delft Univ. of Technol., Netherlands
Volume :
27
Issue :
4
fYear :
2004
Firstpage :
676
Lastpage :
683
Abstract :
Particle-filled polymers are widely used in electronic industries. From microscale view, cure-induced residual stress can be generated not only by the external constraints but also by the constraint effect among the particles. In this paper, a three-dimensional micromechanical finite element method (FEM) model has been setup for a silica particle filled epoxy. In the micromechanical model, the epoxy matrix is modeled with a previously developed cure-dependent viscoelastic constitutive model, whereas the silica particles are modeled as elastic with high stiffness. Cure shrinkage is applied to the matrix as an initial strain for each time increment. The cure-dependent viscoelastic properties were obtained from shear and tension-compression dynamical mechanical analysis measurements. Cure shrinkage and reaction kinetics were characterized with online density measurement and differential scanning calorimeter measurements, respectively. In order to simulate a partly constrained object, the micromechanical model is coupled with a macromodel FEM analysis. The displacements from the macromodel are used as boundary conditions for the micromodel. The effect of external constraints on the generation of the micro stresses is studied by using the boundary conditions related to different external constrained states.
Keywords :
curing; electronics packaging; filled polymers; finite element analysis; internal stresses; shrinkage; viscoelasticity; cure shrinkage; cure-induced stress; differential scanning calorimeter measurements; electronic industries; epoxy matrix; finite element method; macromodel FEM analysis; micro stresses; micromechanical modeling; online density measurement; particle-filled electronic packaging polymer; reaction kinetics; residual stress; shear dynamical mechanical analysis; silica particle filled epoxy; stress evolution; tension-compression dynamical mechanical analysis; viscoelastic constitutive model; Boundary conditions; Density measurement; Elasticity; Electronics industry; Electronics packaging; Micromechanical devices; Polymers; Residual stresses; Silicon compounds; Viscosity; 65; Cure-induced stress; curing process; micromechanical modeling; particle-filled composite; viscoelasticity;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.2004.838871
Filename :
1362801
Link To Document :
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