DocumentCode :
1172553
Title :
Impedance matching for the multilayer medium - toward a design methodology
Author :
Hock, Kai M.
Author_Institution :
Temasek Labs., Nat. Univ. of Singapore, Singapore
Volume :
51
Issue :
3
fYear :
2003
fDate :
3/1/2003 12:00:00 AM
Firstpage :
908
Lastpage :
914
Abstract :
A graphical analysis of the impedance matching problem for the multilayer dielectric and magnetic coating of metallic surfaces, for normal plane wave incidence, is presented, with a view to providing insight into design principles. Methods for visual design using Smith-chart-type graphical tools, which can complement computationally intensive optimization, are derived. The problem of estimating the required permittivity and permeability for given frequency and thickness is also discussed.
Keywords :
electromagnetic compatibility; genetic algorithms; impedance matching; microwave propagation; permittivity; Smith-chart-type graphical tools; computationally intensive optimization; design methodology; electromagnetic compatibility; genetic algorithm; impedance matching; magnetic coating; metallic surfaces; multilayer dielectric coating; multilayer medium; permeability; permittivity; radio wave propagation; Coatings; Design methodology; Design optimization; Dielectrics; Frequency estimation; Impedance matching; Magnetic analysis; Magnetic multilayers; Nonhomogeneous media; Surface waves;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2003.808664
Filename :
1191747
Link To Document :
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