Title :
Equivalence Between Direct and Synthetic Short-Circuit Interruption Tests on HV Circuit Breakers
Author :
St-Jean, Guy ; Wang, RenFu
Author_Institution :
IREQ
fDate :
7/1/1983 12:00:00 AM
Abstract :
Verified thermal models of the circuit breaker arc resistance were used to evaluate the equivalence lence between direct and corresponding currenttioninjec- ion synthetic circuits during short-circuit intetionrup- ion tests. It was observed that it is not sufficient for both circuits to produce the same prospective current ent stress and recovery voltage envelope but that they must have the same topology of their voltage branch although the values of their inductance can be quite different.
Keywords :
Circuit breakers; Circuit testing; Circuit topology; Costs; IEC; Power system faults; Predictive models; Sulfur hexafluoride; Thermal resistance; Voltage;
Journal_Title :
Power Apparatus and Systems, IEEE Transactions on
DOI :
10.1109/TPAS.1983.318210