Title :
New circuit model for RF probe pads and interconnections for the extraction of HBT equivalent circuits
Author :
Lee, Seonghearn ; Gopinath, Anand
Author_Institution :
Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
Abstract :
A new circuit model for RF probe pads and interconnections is proposed, and this model and previous models are compared with measured S parameters of probe pad and interconnection test structures. A modified parameter and interconnnection model was used to determine an HBT equivalent circuit. Excellent agreement is obtained between the extracted equivalent circuit and measured HBT S parameters, while providing physically acceptable parameter values.<>
Keywords :
S-parameters; equivalent circuits; heterojunction bipolar transistors; probes; semiconductor device models; solid-state microwave devices; HBT; RF probe pads; S parameters; circuit model; equivalent circuits; interconnection test structures; interconnections; Atherosclerosis; Circuit testing; Equivalent circuits; Heterojunction bipolar transistors; Integrated circuit interconnections; Parameter extraction; Probes; Prototypes; Radio frequency; Scattering parameters;
Journal_Title :
Electron Device Letters, IEEE
