Title :
Accurate solution of periodic microstrips for digital applications
Author :
Wan, Changhua ; Zheng, Jian-X
Author_Institution :
Zeland Software Inc., Fremont, CA, USA
fDate :
3/1/2003 12:00:00 AM
Abstract :
This paper presents a conformal-mapping analysis of periodic microstrips (PMSs) with zero-thickness strips. The analysis yields closed-form expressions for the common-mode and alternate-differential-mode capacitances, characteristic impedances, and effective dielectric constants of PMSs. The accuracy of the capacitances against electromagnetic simulations is found to be better than 4% in three test cases. The accuracy of approximating the differential-mode capacitance of PMSs using their alternate-differential-mode one is also found to be within 4%. In the case of an air substrate, the capacitances and impedances become exact. These expressions allow a quick estimate of crosstalk-induced impedance and velocity changes on a signal line at or near the center of a data bus consisting of multiconductor microstrips in digital design. A cell of the periodic structure in an alternate differential mode is actually a single microstrip (SMS) with sidewalls and, therefore, the alternate-differential-mode results are equally useful in the design of such an SMS. As expected, calculated alternate-differential-mode data for a large strip spacing approach corresponding common-mode ones and those of a corresponding SMS without sidewalls.
Keywords :
capacitance; conformal mapping; integrated circuit interconnections; microstrip lines; multiconductor transmission lines; periodic structures; permittivity; alternate-differential-mode capacitances; characteristic impedances; closed-form expressions; conformal-mapping analysis; crosstalk-induced impedance; digital applications; effective dielectric constants; multiconductor microstrips; periodic microstrips; periodic structure; signal line; zero-thickness strips; Capacitance; Capacitance-voltage characteristics; Closed-form solution; Crosstalk; Dielectric constant; Dielectric substrates; Impedance; Microstrip; Strips; Testing;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2003.808675