• DocumentCode
    1172750
  • Title

    Small-signal and power evaluation of novel BiCMOS-compatible short-channel LDMOS technology

  • Author

    Bengtsson, Olof ; Litwin, Andrej ; Olsson, Jörgen

  • Author_Institution
    Swedish Linear Microwave AB, Gavle, Sweden
  • Volume
    51
  • Issue
    3
  • fYear
    2003
  • fDate
    3/1/2003 12:00:00 AM
  • Firstpage
    1052
  • Lastpage
    1056
  • Abstract
    We describe a very short-channel 0.15-μm LDMOS transistor with a breakdown voltage of up to 60 V, manufactured in a standard 0.35-μm BiCMOS process. At 1900 MHz and a 12-V supply voltage, the 0.4-mm-gatewidth device with shortest drain drift region gives 100-mW output power P1dB at a drain efficiency of 43%. It has a transducer power gain of over 20 dB. The maximum current gain cutoff frequency fT is 15 GHz, and the maximum available gain cutoff frequency fMAX is 38 GHz. We show the dependence of fT, an fMAX of gate and drain bias for transistors with different drain drift region length. The LDMOS process module does not affect the performance or the models of other devices. We present for the first time a simple way to create high-voltage high-performance LDMOS transistors for an RF power amplifier use even in a very downscaled silicon technology.
  • Keywords
    MOSFET; UHF power amplifiers; UHF transistors; power MOSFET; semiconductor device breakdown; 0.15 micron; 0.35 micron; 100 mW; 12 V; 15 GHz; 1900 MHz; 20 dB; 38 GHz; 43 percent; 60 V; BiCMOS process; RF power amplifier; breakdown voltage; drain drift region length; maximum available gain cutoff frequency; maximum current gain cutoff frequency; power gain; short-channel high-voltage LDMOS transistor; small-signal characteristics; BiCMOS integrated circuits; Cutoff frequency; High power amplifiers; Manufacturing processes; Power generation; Radio frequency; Radiofrequency amplifiers; Silicon; Transducers; Voltage;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2003.808697
  • Filename
    1191767