DocumentCode :
1173057
Title :
On-line transistor modeling in a manufacturing environment
Author :
Butler, Evan
Volume :
20
Issue :
6
fYear :
1973
fDate :
11/1/1973 12:00:00 AM
Firstpage :
683
Lastpage :
687
Abstract :
A transistor modeling program which is designed to operate in a minicomputer in real time has been developed for use in a manufacturing environment. The program resides in a PDP-15 associated with a computer-operated measurement set. The program is designed to aid in the manufacture and characterization of a particular type of high-frequency power transistor which is to be used in an amplifier where precise knowledge and control of frequency response is necessary. The program can produce in 15 
a small-signal ac model of fixed topology which is sufficiently accurate so as to predict the amplifier gain to within 0.01 dB. Explicit analysis equations, the JacobsonOksman optimization algorithm, and certain problem formulation procedures were among techniques implemented in order to model with the necessary speed and accuracy. User experience is described.
a small-signal ac model of fixed topology which is sufficiently accurate so as to predict the amplifier gain to within 0.01 dB. Explicit analysis equations, the JacobsonOksman optimization algorithm, and certain problem formulation procedures were among techniques implemented in order to model with the necessary speed and accuracy. User experience is described.Keywords :
Bipolar transistors; Computer-aided device analysis; Minicomputers; Transistor models; Algorithm design and analysis; Frequency response; High power amplifiers; Jacobian matrices; Microcomputers; Power transistors; Predictive models;
fLanguage :
English
Journal_Title :
Circuit Theory, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9324
Type :
jour
DOI :
10.1109/TCT.1973.1083761
Filename :
1083761
Link To Document :
