• DocumentCode
    1174174
  • Title

    High-power recessed-gate AlGaN-GaN HFET with a field-modulating plate

  • Author

    Okamoto, Yasuhiro ; Ando, Yuji ; Nakayama, Tatsuo ; Hataya, Koji ; Miyamoto, Hironobu ; Inoue, Takashi ; Senda, Masanobu ; Hirata, Koji ; Kosaki, Masayoshi ; Shibata, Naoki ; Kuzuhara, Masaaki

  • Author_Institution
    NEC Corp., Kawasaki, Japan
  • Volume
    51
  • Issue
    12
  • fYear
    2004
  • Firstpage
    2217
  • Lastpage
    2222
  • Abstract
    Recessed-gate AlGaN-GaN heterojunction field-effect transistors (FETs) with a field-modulating plate (FP) have been successfully fabricated for high-voltage and high-power microwave applications. The developed recessed-gate FP-FET with a gate length of 1 μm exhibited an increased transconductance of 200 mS/mm. A series of current collapse measurements revealed that the recessed-gate FP-FET is highly desirable for collapse-free high-voltage power operation. Equivalent circuit analysis demonstrated that the gain loss due to the additional gate feedback capacitance associated with the FP electrode is considerably compensated by increasing the drain bias voltage to more than 30 V. A 48-mm-wide recessed-gate FP-FET biased at a drain voltage of 48 V exhibited a record saturated output power of 197 W with a linear gain of 10.1 dB and a power-added efficiency of 67% at 2 GHz.
  • Keywords
    III-V semiconductors; aluminium compounds; equivalent circuits; field effect transistors; gallium compounds; 197 W; 2 GHz; 48 V; 48 mm; AlGaN-GaN; FP electrode; current collapse measurements; drain bias voltage; equivalent circuit analysis; field-modulating plate; gain loss; gate feedback capacitance; heterojunction field-effect transistors; power operation; recessed-gate AlGaN-GaN HFET; transconductance; Aluminum gallium nitride; Current measurement; Equivalent circuits; FETs; HEMTs; Heterojunctions; MODFETs; Power measurement; Transconductance; Voltage; 65; FET; FP; Field-effect transistors; GaN; field-modulating plate; recess;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2004.838453
  • Filename
    1362991