DocumentCode
1174174
Title
High-power recessed-gate AlGaN-GaN HFET with a field-modulating plate
Author
Okamoto, Yasuhiro ; Ando, Yuji ; Nakayama, Tatsuo ; Hataya, Koji ; Miyamoto, Hironobu ; Inoue, Takashi ; Senda, Masanobu ; Hirata, Koji ; Kosaki, Masayoshi ; Shibata, Naoki ; Kuzuhara, Masaaki
Author_Institution
NEC Corp., Kawasaki, Japan
Volume
51
Issue
12
fYear
2004
Firstpage
2217
Lastpage
2222
Abstract
Recessed-gate AlGaN-GaN heterojunction field-effect transistors (FETs) with a field-modulating plate (FP) have been successfully fabricated for high-voltage and high-power microwave applications. The developed recessed-gate FP-FET with a gate length of 1 μm exhibited an increased transconductance of 200 mS/mm. A series of current collapse measurements revealed that the recessed-gate FP-FET is highly desirable for collapse-free high-voltage power operation. Equivalent circuit analysis demonstrated that the gain loss due to the additional gate feedback capacitance associated with the FP electrode is considerably compensated by increasing the drain bias voltage to more than 30 V. A 48-mm-wide recessed-gate FP-FET biased at a drain voltage of 48 V exhibited a record saturated output power of 197 W with a linear gain of 10.1 dB and a power-added efficiency of 67% at 2 GHz.
Keywords
III-V semiconductors; aluminium compounds; equivalent circuits; field effect transistors; gallium compounds; 197 W; 2 GHz; 48 V; 48 mm; AlGaN-GaN; FP electrode; current collapse measurements; drain bias voltage; equivalent circuit analysis; field-modulating plate; gain loss; gate feedback capacitance; heterojunction field-effect transistors; power operation; recessed-gate AlGaN-GaN HFET; transconductance; Aluminum gallium nitride; Current measurement; Equivalent circuits; FETs; HEMTs; Heterojunctions; MODFETs; Power measurement; Transconductance; Voltage; 65; FET; FP; Field-effect transistors; GaN; field-modulating plate; recess;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2004.838453
Filename
1362991
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